About: Matrix calibration for the quantitative analysis of layered semiconductors by secondary ion mass spectrometry

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Attributs	Valeurs
type	work Article
Is Part Of	http://hub.abes.fr/acs/periodical/ancham/1983/volume_55/issue_13/w
Subject	Article
Title	Matrix calibration for the quantitative analysis of layered semiconductors by secondary ion mass spectrometry
has manifestation of work	http://hub.abes.fr/acs/periodical/ancham/1983/volume_55/issue_13/101021ac00263a010/m/print http://hub.abes.fr/acs/periodical/ancham/1983/volume_55/issue_13/101021ac00263a010/m/web
related by	http://hub.abes.fr/acs/periodical/ancham/1983/volume_55/issue_13/101021ac00263a010/authorship/1 http://hub.abes.fr/acs/periodical/ancham/1983/volume_55/issue_13/101021ac00263a010/authorship/2
Author	Galuska A. A. Morrison G. H.
article type	research-article
is part of this journal	Analytical Chemistry

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