| Abstract
| - A combined scanning electrochemical microscope (SECM)−atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical andelectrochemical measurements at surfaces, under fluid,with high spatial resolution. Simple probe tips suitablefor SECM−AFM, have been fabricated by coating flattenedand etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probeprovides a flexible cantilever (force sensor), while thecoating insulates the probe such that only the tip end(electrode) is exposed to the solution. The SECM−AFMtechnique is illustrated with simultaneous electrochemical-probe deflection approach curves, simultaneous topographical and electrochemical imaging studies of track-etched polycarbonate ultrafiltration membranes, andetching studies of crystal surfaces.
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