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| - Relationships among Resonant FrequencyChanges on a Coated Quartz Crystal Microbalance,Thickness Changes, and Resistance Responses ofPolymer−Carbon Black Composite Chemiresistors
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| - The relationships among frequency changes on a film-coated quartz crystal microbalance, thickness changes,and dc resistance changes have been investigated forcarbon black−insulating polymer composite vapor detectors. Quartz crystal microbalance (QCM) measurementsand ellipsometry measurements have been performedsimultaneously on polymer films that do not containcarbon black filler to relate the QCM frequency changeand the ellipsometrically determined thickness change tothe analyte concentration in the vapor phase. In addition,quartz crystal microbalance measurements and dc resistance measurements on carbon black composites of thesesame polymers have been performed simultaneously torelate the QCM frequency change and dc electrical resistance response to the analyte concentration in the vaporphase. The data indicate that the dc resistance change isdirectly relatable to the thickness change of the polymersand that a variety of analytes that produce a giventhickness change produce a constant resistance changefor each member of the test set of polymers investigatedin this work.
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