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À propos de : Principal Component Analysis: A Versatile Method for Processing and Investigation of XPS Spectra        

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  • Principal Component Analysis: A Versatile Method for Processing and Investigation of XPS Spectra
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  • Given the relevance of principal component analysis (PCA) to the treatment of spectrometric data, we have evaluated potentialities and limitations of such useful statistical approach for the harvesting of information in large sets of X-ray photoelectron spectroscopy (XPS) spectra. Examples allowed highlighting the contribution of PCA to data treatment by comparing the results of this data analysis with those obtained by the usual XPS quantification methods. PCA was shown to improve the identification of chemical shifts of interest and to reveal correlations between peak components. First attempts to use the method led to poor results, which showed mainly the distance between series of samples analyzed at different moments. To weaken the effect of variations of minor interest, a data normalization strategy was developed and tested. A second issue was encountered with spectra suffering of an even slightly inaccurate binding energy scale correction. Indeed, minor shifts of energy channels lead to the PCA being performed on incorrect variables and consequently to misleading information. In order to improve the energy scale correction and to speed up this step of data pretreatment, a data processing method based on PCA was used. Finally, the overlap of different sources of variation was studied. Since the intensity of a given energy channel consists of electrons from several origins, having suffered inelastic collisions (background) or not (peaks), the PCA approach cannot compare them separately, which may lead to confusion or loss of information. By extracting the peaks from the background and considering them as new variables, the effect of the elemental composition could be taken into account in the case of spectra with very different backgrounds. In conclusion, PCA is a very useful diagnostic tool for the interpretation of XPS spectra, but it requires a careful and appropriate data pretreatment.
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