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Deep-UV lithographic response and quantum efficiency calculations of poly((trimethylsilyl)methyl Methacrylate-(chloromethyl)styrene) copolymers
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http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/w
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Title
Deep-UV lithographic response and quantum efficiency calculations of poly((trimethylsilyl)methyl Methacrylate-(chloromethyl)styrene) copolymers
has manifestation of work
http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/101021cm00005a009/m/web
http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/101021cm00005a009/m/print
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http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/101021cm00005a009/authorship/2
http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/101021cm00005a009/authorship/5
http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/101021cm00005a009/authorship/3
http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/101021cm00005a009/authorship/1
http://hub.abes.fr/acs/periodical/cmatex/1989/volume_1/issue_5/101021cm00005a009/authorship/4
Author
Heyward I. P.
Reichmanis E.
Jurek M. J.
Novembre A. E.
Gooden R.
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Chemistry of Materials
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