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| - Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS andSIMS Characterization
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| - Several antimony- and antimony−platinum-doped tin dioxide electrodes supported on titanium have beencharacterized by X-ray photoelectron spectroscopy (XPS) for surface analysis and secondary-ion massspectrometry (SIMS) for in-depth profile analysis. The surface analysis of the freshly prepared electrodesindicates that the Sb/Sn ratio in the electrode surface is similar to the nominal composition in the precursorsolution, but the amount of Pt is higher than this nominal composition. The presence of platinum also producesthe segregation of Sb near the electrode surface. The anodic polarization treatment of the electrode produceschanges in its chemical state. The growth of a passivating hydroxide in the outer layer is the main cause ofthe deactivation of Ti/SnO2−Sb electrodes. The introduction of platinum in the layer prevents the hydroxideformation and modifies the deactivation mechanism of the electrode. The growth of an isolating TiO2 betweenthe support and the active oxide produces the deactivation of Ti/SnO2−Sb−Pt electrodes.
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