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| - Internal Structure of a Molecular Junction Device: Chemical Reduction of PtO2 by TiEvaporation onto an Interceding Organic Monolayer
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| - We present a physical and chemical characterization study of molecular electronic junctions previously shownto display tunable hysteric electrical switching behavior useful for nanoscale memory and logic circuitryapplications. X-ray photoelectron spectroscopy (XPS) data were acquired from the internal buried interfacesin a series of related device structures. This was accomplished using a new technique based on stripping(delaminating) the molecular device stacks at the molecular layer for XPS examination in ultrahigh vacuum(UHV). These data reveal that evaporative deposition of titanium onto the organic monolayers in these junctionsresults in the chemical reduction of the 2.5 nm platinum oxide film underlying the monolayers. Thisunderstanding allows us to construct an improved model for the internal chemical structure of these electricallywell-studied molecular junctions, and to suggest a new model for how the evaporation of titanium as the topcontact in molecular electronic devices prevents electrical shorts in these devices.
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