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Determination of surface structure and orientation of polymerized tetrafluoroethylene films by near-edge x-ray absorption fine structure, x-ray photoelectron spectroscopy, and static secondary ion mass spectrometry
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http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/w
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Determination of surface structure and orientation of polymerized tetrafluoroethylene films by near-edge x-ray absorption fine structure, x-ray photoelectron spectroscopy, and static secondary ion mass spectrometry
has manifestation of work
http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/101021la00026a029/m/print
http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/101021la00026a029/m/web
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http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/101021la00026a029/authorship/3
http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/101021la00026a029/authorship/1
http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/101021la00026a029/authorship/2
http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/101021la00026a029/authorship/4
http://hub.abes.fr/acs/periodical/langd5/1993/volume_9/issue_2/101021la00026a029/authorship/5
Author
Castner David G.
Lewis Kenneth B.
Ratner Buddy D.
Fischer Daniel A.
Gland John L.
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Langmuir
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