| Abstract
| - Thermal template removal from a surface layer of TPA+−silicalite-1 90° intergrowths, performed in gasflow between 150 and 530 °C, was investigated a posteriori by X-ray photoelectron spectroscopy. In theN 1s photoelectron spectrum the low (L) and the high (H) energy line have been observed. These lines areassigned to TPA+ (H line) and nitrogen-containing products of template degradation (L line), respectively.Two types of template species were distinguished: those physisorbed on the amorphous surface and, onthe other hand, those entrapped in the channels of silicalite-1. Linear correlation was established betweensurface and bulk concentrations of entrapped template species. The products of template removal thusmigrate mainly along the boundaries of domains of different crystallographic order.
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