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À propos de : Formation of n-Alkane Layers at the Vapor/Water Interface        

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  • Formation of n-Alkane Layers at the Vapor/Water Interface
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  • We present a study on the initial wetting behaviors of two low molecular weight alkanes, heptane and octane, atthe vapor/water interface using both neutron and X-ray reflectometry. Combined X-ray and neutron reflectivity studiesdata showed that a uniform film, which has never been reported, was formed continuously at 25 °C. As the adsorptivedeposition continued, each adsorbed film was saturated at a specific equilibrium thickness: 48 and 36 Å for deuteratedheptane and octane, respectively, and 21 Å for hydrogenated octane. The thickness of the adsorbed layer measuredby neutron reflectivity is in agreement with that measured using X-ray reflectivity. Our observations of continuousand saturated adsorption behaviors are analyzed qualitatively using a kinetic adsorption model.
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