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À propos de : Characterization of Monolayer Formation on Aluminum-Doped ZincOxide Thin Films        

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  • Characterization of Monolayer Formation on Aluminum-Doped ZincOxide Thin Films
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  • The optical and electronic properties of aluminum-doped zinc oxide (AZO) thin films on a glass substrate areinvestigated experimentally and theoretically. Optical studies with coupling in the Kretschmann configuration revealan angle-dependent plasma frequency in the mid-IR for p-polarized radiation, suggestive of the detection of a Drudeplasma frequency. These studies are complemented by oxygen depletion density functional theory studies for thecalculation of the charge carrier concentration and plasma frequency for bulk AZO. In addition, we report on the opticaland physical properties of thin film adlayers of n-hexadecanethiol (HDT) and n-octadecanethiol (ODT) self-assembledmonolayers (SAMs) on AZO surfaces using reflectance FTIR spectroscopy, X-ray photoelectron spectroscopy (XPS),contact angle, and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. Our characterization of theSAM deposition onto the AZO thin film reveals a range of possible applications for this conducting metal oxide.
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