| Abstract
| - The defocus convergent-beam electron diffraction method has been used for the determination of the displacement vector of a stacking fault in the (∥101) plane of TIO2. The displacement vector has been determined to be [∥0.25 ± 0.00, 0.00±0.03, ∥0.27±0.01]. High-resolution electron microscope (HREM) images show that there is a relaxation of the lattice with a width of about 1 nm around the fault. A structural modelof the fault with a relaxation is proposed, which explains the HREM images well.
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