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Attributs	Valeurs
type	work Issue
Is Part Of	http://hub.abes.fr/oup/periodical/jmicro/2004/volume_53
has manifestation of work	http://hub.abes.fr/oup/periodical/jmicro/2004/volume_53/issue_3/m/print http://hub.abes.fr/oup/periodical/jmicro/2004/volume_53/issue_3/m/web
Date Copyrighted	2004
Rights	© Japanese Society of Microscopy
issue	3
is Is Part Of of	Monte Carlo simulation of topographic contrast in scanning ion microscope Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis Ontogenesis of peripheral electromagnetic receptors in hornets Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method Development of coincidence transmission electron microscope. III. Incorporation with γ-type imaging energy filter Observation of iron silicide formation by plan-view transmission electron microscopy Silk structure in the hornet cocoon Analytical electron microscopy and electron holography on microstructures and magnetic domain structures of Sm-Co 2:17 magnets Chemical junction delineation of a specific site in Si devices The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination Elasticity of flagellar hooks

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