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| - Annealing-Induced Molecular Reorientation in Oligosilane Thin Films
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| Abstract
| - Annealing effects on molecular orientation and multilayer order in vacuum-deposited permethyldecasilanethin films were investigated by means of X-ray diffractometry (XRD) and UV absorption spectroscopy. Anannealing-induced multilayered structure with the molecular orientation oblique to the substrate was observedby XRD. Strong incident-angle dependence of the absorption spectrum of the as-deposited film was mainlydue to a spectral component attributed to a molecular orientation normal to the substrate. After annealing, theabsorption spectrum and its incident-angle dependence significantly changed, which is explained in terms ofmolecular reorientation. Detailed spectral analysis to assign each component to specific molecular orientationis presented.
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