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| - Atomic Force Microscopy Study for SupermolecularMicrostructures in Side-Chain Liquid CrystallinePolymer Films
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| Abstract
| - Atomic force microscopy (AFM) is employed to study the supermolecular microstructures of disclinationsand inversion walls in thin films of a smectic side-chain liquid crystalline polymer. Two-dimensionalnanostripes are formed in thin films when the material enters the smectic phase. A possible mechanismfor their formation is also suggested. The stripes run parallel to the local director and thus decorate theoverall patterns of nematic director around the disclinations and inversion walls. Three patterns involvingradial, spiral, and circular supermolecular microstructures of a positive disclination with s = +1 and onehyperbolic pattern of a negative disclination with s = −1 are observed. The cores of all these microstructuresexhibit circular dark centers in AFM height images. It is found that the specific configurations of a pairof (+1, −1) disclinations form during the late stage of annihilation and inversion walls always separatea pair of (+1, +1) disclinations. The analysis on the director fields around disclinations and inversion wallsshows that the bend and splay elastic constants are of the same order of magnitude in the side-chain liquidcrystalline polymer.
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